Influency of magnification on two computerized analysis methods of scanning electron microscopy

Ph Guignes, J Faure, A Maurette

Abstract


The aim of this study is to compare two computerized analysis methods of SEM dentinal walls views. The first technic is an indirect one using a primary marking and a secondary measurement. The second one is a direct threshold analyse, using the grey levels selection. The influency of the magnification is analysed in a second part.

The first technic is considered as a reference one. The results show that the threshold measurement technic is only reliable at a high magnification. A direct surface measurement cannot be used at a low magnification.

A pretreatment could enhance the ability of a computer to measure the areas covered with smear-layer or organic debris on SEM micrographs.


Keywords


SEM; computerized image analysis; magnification

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