Influency of magnification on two computerized analysis methods of scanning electron microscopy

Abstract

The aim of this study is to compare two computerized analysis methods of SEM dentinal walls views. The first technic is an indirect one using a primary marking and a secondary measurement. The second one is a direct threshold analyse, using the grey levels selection. The influency of the magnification is analysed in a second part.

The first technic is considered as a reference one. The results show that the threshold measurement technic is only reliable at a high magnification. A direct surface measurement cannot be used at a low magnification.

A pretreatment could enhance the ability of a computer to measure the areas covered with smear-layer or organic debris on SEM micrographs.